| Abstract: |
| We propose a novel sampling method as an extension of the linear sampling method for inverse scattering problems. It can determine the location and approximate the support with little a priori information on the physical properties of the unknown target. A key feature is that the input data is the far-field measurement of one incident wave. The behavior of the ill-posed linear integral equations is studied. Furthermore, a multilevel technique is employed to better approximate the scatterer. Numerical experiments show that this method is stable and effective. |
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